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1

Simultaneous determination of refractive index and thickness of multilayer dielectric films by discrete Fourier transform

Oǧuz Köysal, S. Eren San, Serhat Özder

Journal:

Optics Communications

Year:

2004

Language:

english

File:

PDF, 244 KB

english, 2004

2

Determination of phase from the ridge of CWT by using Generalized Morse Wavelet

Kocahan, Ozlem, Tiryaki, Erhan, Coşkun, Emre, Ozder, Serhat

Journal:

Measurement Science and Technology

Year:

2017

Language:

english

File:

PDF, 2.16 MB

english, 2017

3

Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

Özcan, Seçkin, Coşkun, Emre, Kocahan, Özlem, Özder, Serhat

Journal:

Thin Solid Films

Year:

2019

Language:

english

File:

PDF, 3.26 MB

english, 2019

4

Effects of surface potential fluctuations on DLTS of MOS structure

Serhat Özder, İsmai̇l Atilgan, Bayram Katircioḡlu

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 439 KB

english, 1996

5

New approach to bias scan DLTS for rapid evaluation of interface states in MOS structures

Serhat Özder, ⌟smail Atilgan, Bayram Katircioḡlu

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 590 KB

english, 1996

6

Determination of the refractive index dispersion of thick films by continuous wavelet transform

Serhat Özder, Oğuz Köysal, S. Eren San, F. Necati Ecevit

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 640 KB

english, 2004

7

Thickness measurement of dielectric films by wavelength scanning method

Oğuz Köysal, Duygu Önal, Serhat Özder, F. Necati Ecevit

Journal:

Optics Communications

Year:

2002

Language:

english

File:

PDF, 136 KB

english, 2002

8

Molecular reorientation based diffraction in a hybrid liquid crystal system applicable for two different laser sources simultaneously

Oğuz Köysal, S. Eren San, Mustafa Okutan, Serhat Özder

Journal:

Dyes and Pigments

Year:

2007

Language:

english

File:

PDF, 165 KB

english, 2007

9

Phase recovery from interference fringes by using S-transform

Ali Dursun, Zehra Saraç, Hülya Saraç Topkara, Serhat Özder, F. Necati Ecevit

Journal:

Year:

2008

Language:

english

File:

PDF, 1.13 MB

english, 2008

10

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

Coşkun, Emre, Sel, Kıvanç, Özder, Serhat, Kurt, Mustafa

Journal:

Year:

2008

Language:

english

File:

PDF, 1.56 MB

english, 2008

11

Paul wavelet algorithm for the determination of birefringence dispersion of a liquid crystal cell

Coşkun, Emre, Özder, Serhat

Journal:

Journal of the Optical Society of America B

Year:

2011

Language:

english

File:

PDF, 576 KB

english, 2011

12

Optical phase distribution evaluation by using an S-transform

Özder, Serhat, Kocahan, Özlem, Co?kun, Emre, Gökta?, Hilal

Journal:

Year:

2007

Language:

english

File:

PDF, 307 KB

english, 2007

13

Determination of birefringence dispersion in nematic liquid crystals by using an S-transform

Özder, Serhat, Coskun, Emre, Köysal, Oguz, Kocahan, Özlem

Journal:

Year:

2007

Language:

english

File:

PDF, 224 KB

english, 2007

14

Determination of the refractive index of a dielectric film continuously by the generalized S-transform

Coşkun, Emre, Sel, Kıvanç, Özder, Serhat

Journal:

Year:

2010

Language:

english

File:

PDF, 189 KB

english, 2010

15

Holographic recording study of a hybrid liquid crystal system doped with dye and fullerene

S. Eren San, Oğuz Köysal, F. Necati Ecevit, Serhat Özder, Dmitri Dvornikov

Journal:

Synthetic Metals

Year:

2004

Language:

english

File:

PDF, 129 KB

english, 2004

16

Admittance analysis of an MIS structure made with PECVD deposited a-SiNx:H thin films

İsmail Atilgan, Serhat Özder, Orhan Özdemir, Bayram Katircioğlu

Journal:

Journal of Non-Crystalline Solids

Year:

1999

Language:

english

File:

PDF, 302 KB

english, 1999

17

Gas source molecular beam epitaxy growth and characterization of modulation-doped field-effect transistor structures

Besikci, Cengiz, Civan, Yavuz, Ozder, Serhat, Sen, Ozlem, Jelen, Chris, Slivken, Steve, Razeghi, Manijeh

Journal:

Semiconductor Science and Technology

Year:

1997

Language:

english

File:

PDF, 173 KB

english, 1997

18

The Paul wavelet algorithm: an alternative approach to calculate the refractive index dispersion of a dielectric film from transmittance spectrum

Emre Coşkun, Serhat Özder, Erhan Tiryaki

Journal:

Applied Physics B: Lasers and Optics

Year:

2013

Language:

english

File:

PDF, 485 KB

english, 2013

19

Continuous wavelet transform analysis of projected fringe patterns

Dursun, Ali, Özder, Serhat, Ecevit, F Necati

Journal:

Measurement Science and Technology

Year:

2004

Language:

english

File:

PDF, 312 KB

english, 2004

20

[IEEE 2008 IEEE 16th Signal Processing, Communication and Applications Conference (SIU) - Aydin, Turkey (2008.04.20-2008.04.22)] 2008 IEEE 16th Signal Processing, Communication and Applications Conference - Profile measurement of objects by using stockwell and continuous wavelet transforms

Kocahan, Ozlem, Coskun, Emre, Ozder, Serhat

Year:

2008

Language:

turkish

File:

PDF, 913 KB

turkish, 2008

21

THE BEHAVIOR OF THE STRANGE QUARK MATTER IN THE FRW UNIVERSES

YILMAZ, IHSAN, KUCUKARSLAN, AYSE, OZDER, SERHAT

Journal:

International Journal of Modern Physics A

Year:

2007

Language:

english

File:

PDF, 232 KB

english, 2007

22

Generalized Morse wavelets for the phase evaluation of projected fringe pattern

Yılmaz, Özlem Kocahan, Coşkun, Emre, Özder, Serhat

Journal:

Measurement Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.60 MB

english, 2014

23

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - S-transform analysis of projected fringe patterns

Kocahan, Özlem, Özder, Serhat, Coşkun, Emre, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.

Year:

2007

Language:

english

File:

PDF, 380 KB

english, 2007

24

The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

Kocahan, Özlem, Özcan, Seçkin, Coşkun, Emre, Özder, Serhat

Journal:

Measurement Science and Technology

Year:

2017

Language:

english

File:

PDF, 1.59 MB

english, 2017

25

AIP Conference Proceedings [Author(s) TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32) - Bodrum, Turkey (6–9 September 2016)] - An improved method for determination of refractive index of absorbing films: A simulation study

Özcan, Seçkin, Coşkun, Emre, Kocahan, Özlem, Özder, Serhat

Year:

2017

Language:

english

File:

PDF, 279 KB

english, 2017

26

AIP Conference Proceedings [Author(s) TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32) - Bodrum, Turkey (6–9 September 2016)] - A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet

Tiryaki, Erhan, Coşkun, Emre, Kocahan, Özlem, Özder, Serhat

Year:

2017

Language:

english

File:

PDF, 579 KB

english, 2017

27

AIP Conference Proceedings [Author(s) TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32) - Bodrum, Turkey (6–9 September 2016)] - 3D profile measurements of objects by using zero order Generalized Morse Wavelet

Kocahan, Özlem, Durmuş, Çağla, Elmas, Merve Naz, Coşkun, Emre, Tiryaki, Erhan, Özder, Serhat

Year:

2017

Language:

english

File:

PDF, 752 KB

english, 2017

28

AIP Conference Proceedings [AIP Publishing LLC 9TH INTERNATIONAL PHYSICS CONFERENCE OF THE BALKAN PHYSICAL UNION (BPU-9) - Istanbul, Turkey (24–27 August 2015)] - An improved method for the determination of birefringence dispersion of liquid crystal cell: A simulation study

Özcan, Seçkin, Coşkun, Emre, Kocahan, Özlem, Özder, Serhat

Year:

2016

Language:

english

File:

PDF, 343 KB

english, 2016

29

[IEEE 2017 Computing and Electromagnetics International Workshop (CEM) - Barcelona, Spain (2017.6.21-2017.6.24)] 2017 Computing and Electromagnetics International Workshop (CEM) - Quantitative phase imaging of red blood cell by diffraction phase microscopy

Kocahan, Ozlem, Tiryaki, Erhan, Durmus, Cagla, Elmas, Merve Naz, Coskun, Emre, Ozder, Serhat

Year:

2017

Language:

english

File:

PDF, 437 KB

english, 2017

30

AIP Conference Proceedings [Author(s) TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32) - Bodrum, Turkey (6–9 September 2016)] - Optical phase distribution evaluation by using zero order Generalized Morse Wavelet

Kocahan, Özlem, Elmas, Merve Naz, Durmuş, Çağla, Coşkun, Emre, Tiryaki, Erhan, Özder, Serhat

Year:

2017

Language:

english

File:

PDF, 653 KB

english, 2017

31

Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

Özcan, Seçkin, Coşkun, Emre, Kocahan, Özlem, Özder, Serhat

Journal:

Thin Solid Films

Year:

2019

File:

PDF, 3.26 MB

2019

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